Field - and Photoassisted Field Emission Studies of Calcium Fluoride Coated Silicon Tips
نویسندگان
چکیده
Measurements of field emission current-voltage and Fowler-Nordheim characteristics of Si tips covered by 100 nm-thick Ca& epitaxial layers have been for the first time performed. It was found that in spite of dielectric nature of the coating, the tips demonstrate high emissivity comparable with the diamond coated tips. Results of high resolution photoassisted field emission investigations of C W S i structures are presented.
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تاریخ انتشار 2017